The Nano-Characterization Lab
Manager: Professor Leonard Brillson
Facilities are: a PHI TRIFT 3 Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) facility and a PHI 5000 Versaprobe X-Ray Photoemission Spectroscopy (XPS) facility
SIMS Capabilities are:
XPS Capabilities are:
Costs are for Ohio State University users :
$150 per hour for analysis of samples.
$150 per hour for additional work up of data from the analysis of samples
Costs for off campus user are different. Please contact Dr. Leonard Brillson at email@example.com for analysis costs and availability.
Rates Effective : April 30, 2009
This is a picture of the SIMS setup. The foreground has is the TOF-SIMS and the background chamber is a up and coming MBE system.
Contact Dr. Brillson at firstname.lastname@example.org for initial sample overview and personal introduction
Contact Dr. Leonard Brillson at email@example.com for sample run times, data work up requirements and sample preparation requirements
Location is in the basement of Dreese room 020
go to the following link to get more information on Professor Brillson's research.