The Nano-Characterization Lab

Manager:   Professor Leonard Brillson

Facilities are: a PHI TRIFT 3 Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) facility and a PHI 5000 Versaprobe X-Ray Photoemission Spectroscopy (XPS) facility

SIMS Capabilities are:   

• Imaging SIMS at a 120 nm resolution
• SIMS depth profiling at a 3 nm resolution 
• High mass capabilities for polymer and bio samples.  Special sample prep. requirements for these types of samples
• High mass resolution for separation of near identical masses

XPS Capabilities are:   

• Imaging XPS at 2-10 um resolution
• XPS depth profiling at a 3 nm resolution 
• Chemical shift information.  Fermi level positions relative to band edges
• Valence band photoemission spectra

Costs are for Ohio State University users :

                    $150 per hour for analysis of samples.

                    $150 per hour for additional work up of data from the analysis of samples 

Costs for off campus user are different.   Please contact Dr. Leonard Brillson at brillson.1@osu.edu for analysis costs and availability. 

Rates Effective :  April 30, 2009

This is a picture of the SIMS setup.  The foreground has is the TOF-SIMS and the background chamber is a up and coming MBE system.

Contact Dr. Brillson at brillson.1@osu.edu for initial sample overview and personal introduction

Contact Dr. Leonard Brillson at brillson.1@osu.edu for sample run times, data work up requirements and sample preparation requirements

Location is in the basement of Dreese room 020

go to the following link to get more information on Professor Brillson's research.

http://emnlab.eng.ohio-state.edu