The Nano-Characterization Lab

Manager:   Professor Leonard Brillson


Facilities are: a PHI TRIFT 3 Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) facility and a PHI 5000 Versaprobe X-Ray Photoemission Spectroscopy (XPS) facility


SIMS Capabilities are:   



XPS Capabilities are:   



Costs are for Ohio State University users :

                    $150 per hour for analysis of samples.

                    $150 per hour for additional work up of data from the analysis of samples 

Costs for off campus user are different.   Please contact Dr. Leonard Brillson at for analysis costs and availability. 

Rates Effective :  April 30, 2009


This is a picture of the SIMS setup.  The foreground has is the TOF-SIMS and the background chamber is a up and coming MBE system.


Contact Dr. Brillson at for initial sample overview and personal introduction

Contact Dr. Leonard Brillson at for sample run times, data work up requirements and sample preparation requirements

Location is in the basement of Dreese room 020

go to the following link to get more information on Professor Brillson's research.